Volume 27, Issue 2 (1-2009)                   2009, 27(2): 199-211 | Back to browse issues page

XML Persian Abstract Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:
S. Vahabzadeh, M. A. Golozar, F. Ashrafizadeh and A. Ghasemi. Annealing Effects on Microstructure and Microwave Properties of CuO-Doped (Zr0.8Sn0.2)TiO4. Journal of Advanced Materials in Engineering (Esteghlal) 2009; 27 (2) :199-211
URL: http://jame.iut.ac.ir/article-1-461-en.html
Annealing Effects on Microstructure and Microwave Properties of CuO-Doped (Zr0.8Sn0.2)TiO4
S. Vahabzadeh * , M. A. Golozar , F. Ashrafizadeh and A. Ghasemi
Abstract:   (6255 Views)
This article has no abstract.
Keywords: Zirconium tin titanate, Copper oxide, Dielectric resonator, Quality factor, Annealing
Full-Text [PDF 572 kb]   (1246 Downloads)    
Type of Study: Research | Subject: General
Received: 2014/10/25 | Published: 2009/01/15
Add your comments about this article : Your username or Email:
CAPTCHA

© 2024 CC BY-NC 4.0 | Journal of Advanced Materials in Engineering (Esteghlal)

Designed & Developed by : Yektaweb